Created: 02/23/07 by EF Updated: 09/08/13 by EF
After some detective work, Mark, TG and EF agreed that the symptom was that the top rows of amps 3 and 4 (abutting amps 1 and 2, respectively), when binned by 2, contained a sum of data and bias levels and therefore had unexpectedly low counts. These amps have a single overscan row at the top. Therefore, we concluded that there was an erroneous offset by 1 row in the row counters for amps 3 and 4, such that at the top, binning by 2 resulted in summing data and bias. Steve Amato in Cambridge was able to quickly correct the offset in the chip's signal and pattern files on 01/31/07. After a single iteration with TG, we verified with flats that the problem had been corrected. Mark confirmed that in subsequent KIC images.